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3D Optical Profiler

Date Posted: 09 Oct 2009
Offer Expires: 09 Apr 2010

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Shanghai Selon Scientific Instrument Co., Ltd. China (Mainland)

29F, Building 2nd, Lane 388, Kunming Road, Shanghai, Shanghai, China (Mainland)
Contact Person: Mr. Victor Tu
Telephone: 86-21-35100022
Fax: 86-21-65416501
Contact Details
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Detailed Buying Lead Description

SWIM-1510MS

Non-Contact Nano-depth 3D Surface Profiler

(Scanning White-light Interferometric Microscope)

Features:

  • 0.1nm resolution in height/depth
  • Micro-3D Depth Inspection
  • High-speed/ Non-contact area alanysis
  • Non-electron beam/Non-laser
  • Transparent material is also suitable 
  • Surface profile/ roughness analysis

Applications:

Nano-depth 3D profile fast presents. Carmar's SWIM-1510MS designs with the latest scanning white-light interferometric technology. Outstanding performance with simple operation, customer design flexibility and high-precision scanning, the Micro-3D profile and surface texture can be done by non-contact and non- constructive operation in normal environment. Moreover, nano-level surface roughness and step height calculation are traced to ISO International standardization. 

Powerful SWIM series white-light Interferometer can acquire the scanning data of FOV in a few seconds. 3D profile and height inspection results obtaining is better than point to point con-focal microscope. The 3D graphic measuring ability is better than scanning electron microscope.

No matter the polishing, rough layer, or even the transparent material can be inspected by SWIM as long as the reflection rate of measured object is over 1%. SWIM is suitable for the inspections of surface profiles and micro-structure for all kinds of materials and components. The applications are as below:

  •  Glass lens

  •  Coating surface

  •  Semiconductor Wafers

  •  Data Storage Surface (HDD, DVD, CD)

  •  MEMS Components

  •  LCD

  •  high-density interconnect PCB

  •  IC  Package

  •  Micro Mechanical Parts and analysis and surface research of other materials and Precision Machined Surface.

Vertical Phase Shift Interferometry scanning technology, depth resolution can reach 0.1nm

SWIM series provides Vertical Resolution: 0.1 nm, Lateral Space Resolution: 0.61nm(50X lens) with max vertical scanning speed can go up to 12μm/s.  The ability of high speed presentation of 3D Micro-Profile is necessary tool for research, RD, and quality check for production.

  

Specifications ( Motorized stage and Auto-focus module are optional )

Model

SWIM 1510MS

Objectives Magnification

10X

20X

50X

Field of View
(Length X Width)
Unit: mm

Standard

0.43 X 0.32

0.21 X 0.16

0.088 X 0.066

Enhanced

1.67 X 1.33

0.84 X 0.67

0.34 X 0.27

Optical resolution (um)

1.12

0.84

0.61

Working distance (mm)

7.4

4.7

3.4

Optical system

Scanning White-light Microscope System

Height measurement

Scanning Range

100 mm  ( 400 mm, Optional)

Resolution

0.1 nm

Repeatability (σ) 

0.1 %    ( Range: > 10 um

10 nm   ( Range: 1 um ~ 10 um)

   5 nm   ( Range:  <1 um )

Control mode

Auto

Scanning speed (um/s)

12 Max.

Light source

Type

Halogen

Life

1000 hours

Light intensity adjustment

Auto/ manual

Imaging Unit
Image sensor

High speed CCD Camera

Resolution
Standard

640 x 480 pixels

Enhanced

1280x  1024 pixels

Sample stage

Stage

Travel

150 mm x 100 mm, manual

Load

> 10 kg

Travel range of Z axis

80 mm, manual

Displacement Display

3-axis linear encoder (resolution 1 um)

Tilt adjustment stage

manual

Base

Granite

Data processing Computer

CPU

Core duo CPU

Display Unit

LCD monitor

HD

160 GB or higher

OS

WindowsXP (2)

Power

AC110V/ 220V, 50Hz/ 60Hz

Weight

150 kg (Including granite base)

Analysis software

MS-Windows compatible data acquisition and analysis software, including: ISO roughness/step-height analysis, FFT and filtering, various 2Dand 3D views, profile analysis, zooming, conversion to standard image formats, etc.  
Step Height Standard (Optional)

50 nm~ 150 mm

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