Auto Testing Machine, Initial Tack Test for adhesive
To measure the primary adhesive property of adhesives
0 ~ 60°
Testable Area Width:
Standard Steel Ball:
1/32 inch ~ 1 inch
320 mm (L) x 140 mm (W) x 180 mm (H)
Packaging & Delivery
7 working days
Adhesive tape and label Initial Tack Tester is designed for initial tack tests of pressure-sensitive adhesive tapes, adhesive bandages (plasters), labels, and protective films and etc.
This Adhesive Tape Initial Tack Tester conforms standards of , JIS Z0237, GB 4852
Features: Rolling ball method Adjustable angle
Principle This Initial Tack Tester employs the rolling ball method and tests the primary adhesive properties of the specimen by observing the adhesive effect occurred immediately after the rolling ball and the adhesive specimen come into contact.
Test area width
Standard steel balls
PARAM CZY-6S Lasting Adhesive Tester
PARAM FPT-F1 Friction/ Peel Tester
Flexible Packaging Testing Machines
Packaging & Shipping
Basically, we choose delivery the equipment by air for you. But you can choose the way you perfer. Our packaging will be the standard veneer package for the Tensile Strength Testing Equipment.
Labthink owns complete service system:
The Labthink Global Customer Service Center provides customers with professional, prompt and sustained pre-sale, point-of-sale and after-sale services in Chinese, English, French, Spanish, Portuguese, Russian, Arabic and other languages. The Labthink Global Customization Center offers customized professional solutions to meet individual customer needs.
Visualized remote service
Training in Labthink
Labthink instruments have been widely used and recognized by more than 6,000 scientific institutional laboratories, inspection organizations, and universities and corporate quality control departments.
For more information, please feel free to contact us via (tel) 0086-531-85068566.
Labthink is dedicated to providing professional consulting, testing instruments, support services, and quality assurance solutions for packaging in various fields.