Light Section Measuring Microscopes detect depths and heights with a non-contact optical method. The
Light Section Measuring Microscopes detect depths and heights with a non-contact optical method. They detect the unevenness of surfaces without touching them using light rays, and are ideally suited for measurements in the range of 5 microns to 50 millimeters.
Projection slit light, reference slit light, and incident light are changed from tungsten lamp to durable halogen light source to ensure optimum illumination on the object surface for fatigue-free, precise measuring work.
The viewfield of object measuring surface covered by halogen light is widened and precision measuring work is possible by non-technical people without any special training.
Projection slit, vertical illumination and standard slit illumination are changed to the combination of halogen lamp and fiber optic guide.
The improvement in illumination and area create a fatigue-free measuring environment.
A large specimen table for large-size objects can be installed.