Winner high-precision laser particle size analyzers" which belong to wet-desktop laser particle size analyzers are latest developed products of high-end by Jinan Winner particle Technology Co., Ltd with many years of experience in particle testing.

This product not only follow the built-in cycle of decentralized systems, non-binding free fitting technology and high-sensitivity of the Central photoelectric detectors installed of Winner2000, but also added all-wave scattered light detection technology with a multi-detector designated resettlement. Thus it will not miss any point of the scattering information. It improves the repeatability of the test results and high precision further, which becomes a good help to particles research.

  Within the scope of the test, this product applies the whole series of national standard GBW (E) 1200000 calibration to ensure the high-precision test results of the entire range. The test data is competitive with similar products abroad. Especially, the accurate determination of the backward precise scattering, minimize the threshold measurement to physical limits (50 nanometer) of static light scattering particle size. Its technical content and stability take the first place between similar Products in state. Winner2005 laser particle size analyzer got the high praise of Peking University, Shanghai University of technology  and other colleges and universities of China, once on its coming out.

 All-wave scattering light detection technology: Set up a multi-detection system of scattering forward, lateral ward, backward, the product contains a all-wave scattering information that can get a more accurate test result, and expands the range to 0.05-780 microns effectively.

Using a more powerful wet decentralized system: The use of a more powerful cycle of decentralized systems than Winner2000, expands the scope of the measure, at the same time ensures a better dispersion of the particles. It can ensure a real test result to users.

With a MIE scattering model generation system and sample models, the software can generate scattering model at any time according to complex index of refraction of the samples. This feature is a prerequisite to improve the accuracy about the analysis of the ultra-fine particle size.