Detailed Product Description

The si720 is a high power, high accuracy, high resolution compliment to the Micron optics si425. It provides higher accuracy and resolution than the si425 and can be used for a wide variety of optical sensors. The system provides users with a complete understanding of how the spectral shape of the sensor reacts to varying physical conditions rather than only reporting shifts in central wavelengths from FBGs. This instrument is used both as the first step in the development of high volume custom sensing systems and in long term field measurements.

The self-contained system is composed of:

Features

• Useful in the design and selection of optical sensors and high-volume sensor interrogation systems.
• High accuracy, resolution and full profile data provide comprehensive feedback on sensor capabilities
• LabVIEW peak detection utility provides high resolution, high accuracy Bragg grating center wavelength measurements
• Whole spectrum measurement aids in understanding how sensors characteristics change under various physical conditions
• Useful for analysis of a wide variety of passive optical sensors FBGs, Fabry-Perot sensors, Long period Gratings, etc.

Applications

• Two channels and the powerful swept laser source simultaneously monitor more than 100 sensors
• All sensors on all channels are scanned at 5 Hz
• Wavelength resolution is 0.25 pm and wavelength accuracy is +/- 1 pm
• Data is easily transferred to PC via GPIB interface at 5 Hz
• The laser source and wavelength detectors are contained in a compact, rugged package. Data processing is achieved on a laptop PC