Atomic force microscope uses the micro cantilever to sense and amplify the force between the sharp probe on the cantilever and the atoms of the sample under test, so as to achieve the purpose of detection, with atomic resolution. Atomic force microscope can observe both conductor and non-conductor, which makes up for the deficiency of scanning tunneling microscope.
The basic principle of atomic force microscopy is: one end of a micro cantilever that is extremely sensitive to weak forces is fixed, and the other end has a tiny needle tip. The needle tip is gently in contact with the sample surface. By controlling the constant of this force during scanning, the microcantilever with the needle tip will undulate in the direction perpendicular to the surface of the sample corresponding to the equipotential surface of the force between the needle tip and the surface of the sample. By using the optical detection method or the tunnel current detection method, the position change of the cantilever corresponding to each point of the scan can be measured, so that the information on the surface morphology of the sample can be obtained.
The laser detection head is integrated with the sample scanning stage, which is stable and reliable; Precision laser and probe positioning device, easy to change probe and adjust light spot; The single-axis driven sample automatically approaches the probe vertically, accurately positioning the scanning area so that the needle tip is perpendicular to the sample scanning; Motor-controlled intelligent needle feeding method for automatic detection of pressurized ceramics to protect probes and samples; 4X objective lens optical positioning, no need to adjust the focus, real-time observation and positioning of the probe sample scanning area; Spring suspension type shockproof method, simple and practical, good shockproof effect; Metal shielded soundproof box, built-in high-precision temperature and humidity sensor, real-time monitoring of the working environment; Integrated scanner hardware non-linear correction user editor, nano-characterization and measurement accuracy better than 98%
Basic working modes: contact mode, tap mode, F-Z force curve measurement, RMS-Z curve measurement Optional working mode: friction / lateral force, amplitude / phase, magnetic force and electrostatic force Sample size: Φ≤90mm, H≤20mm Scanning range: 20um in XY direction, 2um in Z direction (optionally 10um in XY direction, 1um in Z direction) Scanning resolution: 0.2nm in XY direction, 0.05nm in Z direction Sample moving range: 0 ~ 13mm Optical magnification 4X, optical resolution 2.5um Scan rate 0.6Hz ~ 4.34Hz, scan angle 0 ~ 360 ° Scan control: XY uses 18-bit D / A, Z uses 16-bit D / A Data sampling: 14-bit A / D, dual 16-bit A / D multi-channel synchronous sampling Feedback mode: DSP digital feedback Feedback sampling rate: 64.0KHz Communication interface: USB2.0 / 3.0 Operating environment: WindowsXP / 7/8/10 operating system
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