Atomic force microscope (AFM)

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$12,000.00 - $17,700.00 / Unit | 1 Unit/Units (Min. Order)
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Overview
Quick Details
Subject:
Physics
Brand Name:
Brolight
Model Number:
SEK-8502
Place of Origin:
Zhejiang, China
Supply Ability
Supply Ability:
100 Unit/Units per Month
Packaging & Delivery
Packaging Details
Carton
Port
Shanghai Airport or Ningbo Port

 

Atomic force microscope

SEK-8502

 

DETAILS

 
 
 

 

 

Principles:

AFM is one of the most widely used surface observation and research tools in SPM family. The principle of AFM is based on the interaction (atomic force) between microprobe and sample. When a sharp microprobe approaches a sample to a very short distance S, such as several nanometers or smaller, an atomic force F will occur between the atoms of microprobe tip and those of sample surface. In accordance with the F-S relationship curve, attractive atomic force is dominant when the distance is comparatively larger, while repulsive atomic force becomes predominate as the distance getting much smaller. On the basis of these relationships, AFM is able to obtain 3D micro/nano-morphology of sample surface by detecting atomic forces using beam deflection method when a cantilever-combined microprobe scans over the sample.

 Feature: 

Specially-designed horizontal AFM probe unit

The SEK-8502 AFM owns a specially-designed horizontal AFM probe unit to eliminate the interference between atomic force and gravity. It is also able to reduce the center of gravity and avoid the vertical creeps of coarse and fine adjustment mechanisms. Moreover, the AFM probe unit enables visualization of the optical path. In these ways, the novel AFM and its probe unit is of more stability and superior performances.

 

Stabilized tri-axial piezoelectric scanner

It utilizes a stabilized tri-axial piezoelectric scanner which is able to eliminate the coupling of X, Y and Z piezoelectric elements between each other, as to avoid the image distortion. The scanner ensures better scanning linearity and independence, higher intensity and rigidity, as well as stronger driving force. Therefore, the scanner as well as the AFM instrument is more suitable for scanning small and/or large, light and/or heavy samples.

 

Optimized scanning and feedback controlling system

With optimized scanning and feedback controlling system and multi-channel high-precision A/D&D/A interfaces, the AFM owns higher scanning and imaging resolution, better repeatability and enhanced image quality.

 

Perfect software interfaces and functions

The AFM software is of powerful functions, friendly interfaces, and suitable for Windows XP/Win7/Win8 /Win10 and other operating systems. Any ordinary user can easily learn the software operation and then become skilled at it quickly.

 

Simple and convenient instrument operation

The operation of this AFM is quite simple and convenient so that any ordinary user and learner can carry out the operation, while no professional and skilled staff is demanded. Each process of probe tip installation, sample installation, coarse and fine approaching, image scanning, image acquisition and other operations can be completed within 1 minute for each. Therefore, It is much more suitable for scientific research, teaching experiments and product testing.

 

High stability and better anti-disturbance/interference performances

The AFM can work perfectly under both good and common experimental conditions. It is capable of scanning samples and obtaining satisfactory images in general laboratories and rooms, on ordinary desks or tables, and under environments with slight vibration, disturbance and interference, etc. In other words, it is of better stability, better anti-disturbance capability, stronger anti-(optical, electric, electronic, and magnetic, etc.) interference performances, and faster scanning speed (up to 1 image/1~6 seconds).

 

 

The AFM can be widely applied in scientific research, undergraduate and graduate teaching experiments and nano-products testing. It is suitable for scanning and imaging various materials such as metals/nonmetals, conductors/semiconductors/non-conductors, and magnets/non-magnets, etc, while no special requirement of sample preparation is demanded.

 

Typical Experiments And Data

Some sample images scanned using the AFM

 
 

 Parameters:

  • The SEK-8502 AFM can be used in scientific research and teaching experiments for graduate and undergraduate students. Simple and convenient operation, no professional and skilled staff is demanded.
  • With specially-designed horizontal AFM probe unit, it can eliminate the vertical creeps of the tip, sample and adjustment mechanisms, owning higher stability and better anti-vibration/disturbance capability.
  • It adopts an open and visualized design of optical path, that is, the entire optical path is observable during operation, so as to better satisfy the operating requirements of the users.
  • The AFM can work perfectly under both good and common experimental conditions. Especially, it is able to work in ordinary laboratories and rooms, and on common desks or tables.
  • It can work properly under the common environments with light illuminating, slight vibration and people walking, etc.
  • Maximum scan range: 4000 nm x 4000 nm.
  • Resolution: Laterally 0.2 nm, longitudinally 0.1 nm.
  • Scan speed: Adjustable with maximum scan rate up to 1 image/1~6 seconds.
  • Size of sample: Maximum 30 mm x 30 mm x 10 mm.
  • Image pixels: 100 x 100 pixels, 200 x 200 pixels, 400 x 400 pixels; or 256 x 256 pixels, 512 x 512 pixels per image, grayscale 256.
  • Image formats: BMP format which can be converted into any other image format.
  • 15 groups (60 tips) AFM microprobes for each AFM. Each microprobe owns four cantilevers with different force constants and effective lengths of 100 mm and 200 mm.
  • Equipped with all-in-one PC computer/color LCD and AFM software.
  • Equipped with USB-based optical microscopic monitoring system (field of view 1500 μm, optical resolution 0.5 μm).

Parts list

Item

Description

Qty

1

AFM probe unit

1

2

AFM control box (SEK-8502 model)

1

3

DC power supply (300V)

1

4

A/D&D/A control interface

1

5

AFM microprobe

15 (60 tips) 

6

USB-based optical microscope

1

7

All-in-one PC computer, including AFM software

1

8

Sample

5

9

Sample stage

5

10

Scissors, tweezers, screwdriver, magnifying glass, etc.

1

11

Datasheet and Manual

1