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FM-NanoviewOp-AFM Optical Atomic Force Microscope
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Xian Yima Optoelec Co., Ltd.
15 yrs
CN
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Key attributes
Industry-specific attributes
Theory
Atomic Force Microscope
Drawtube
Monocular
Other attributes
Place of Origin
Shaanxi, China
Type
Scanning Probe Microscope
Brand Name
FEISHIMAN
Model Number
FM-NanoviewOp-AFM
Sample size:
D ≤ 90mm, H ≤ 20mm
Application
A wide range of applications
Sample movement range
0~20mm
Feedback method
DSP digital feedback
Communication interface
USB2.0/3.0
Product number
GDXyzl004
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Lead time
Quantity (sets)
1 - 1
> 1
Lead time (days)
15
To be negotiated
Product descriptions from the supplier
1 - 4 sets
$10,600.00
>= 5 sets
$9,800.00
Quantity
-
+
Shipping
Shipping solutions for the selected quantity are currently unavailable
Item subtotal (0 variations 0 items)
$0.00
Shipping total
$0.00
Subtotal
$0.00
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