High Configure CNC Vision Measurement Instrument TP20 Advanced Optical Quadratic Element Measure for Metrology Laboratory

Technical specifications

Customization guide

Adjustable measurement parameters (e.g., resolution, field of view, and scan speed) to accommodate specialized needs in R&D, semiconductor inspection, or aerospace component analysis.

Get inspired

The TP20’s granite base and advanced optics enable precise measurements for quality control in automotive manufacturing, semiconductor fabrication, and academic research.

Choose your model

Supplier's note

1. Three Breakthroughs:

   • Granite Base Stability: Reduces thermal drift by 40% compared to aluminum bases, critical for labs requiring sub-micron precision.
   • Quadratic Element Sensors: Deliver 25% higher resolution than standard CCD arrays for complex 3D surface mapping.
   • Multi-Certification Compliance: EPR_Germany_Packing ensures seamless adoption in automotive supply chains.

2. Version Selection Guidance:

   • Base Model: Ideal for educational labs or small-scale manufacturing needing basic accuracy (e.g., PCB inspection).
   • Advanced Model: Perfect for mid-tier quality control teams requiring faster scans (60/min) and AI-driven defect detection in automotive parts.
   • Pro Model: Best for aerospace/R&D facilities demanding ±1 µm precision and cloud-linked data for real-time collaboration.

With the Pro Model’s ±1 µm accuracy, you can achieve sub-micron precision in semiconductor manufacturing. The Advanced Model’s 20% faster scan speed than the Base Model ensures efficient quality checks in high-volume production lines.