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  • High and Low Temperature Vacuum Magnetic Field Probe Station for Testing Semiconductor Materials Magnetic Materials
  • High and Low Temperature Vacuum Magnetic Field Probe Station for Testing Semiconductor Materials Magnetic Materials
  • High and Low Temperature Vacuum Magnetic Field Probe Station for Testing Semiconductor Materials Magnetic Materials
  • High and Low Temperature Vacuum Magnetic Field Probe Station for Testing Semiconductor Materials Magnetic Materials
  • High and Low Temperature Vacuum Magnetic Field Probe Station for Testing Semiconductor Materials Magnetic Materials
  • High and Low Temperature Vacuum Magnetic Field Probe Station for Testing Semiconductor Materials Magnetic Materials
High and Low Temperature Vacuum Magnetic Field Probe Station for Testing Semiconductor Materials Magnetic Materials

High and Low Temperature Vacuum Magnetic Field Probe Station for Testing Semiconductor Materials Magnetic Materials

  • 1 - 9 Sets
    $40,000
  • 10 - 99 Sets
    $35,000
  • >= 100 Sets
    $30,000

Customization:

Customized logo(Min.Order: 1 pieces)
Customized packaging(Min.Order: 1 pieces)
Graphic customization(Min.Order: 1 pieces)

High and Low Temperature Vacuum Magnetic Field Probe Station for Testing Semiconductor Materials Magnetic Materials

Product overview

Core functionalities

Applicable scenarios

Unique advantages

  • High/Low Temperature Testing: Enables precise analysis of semiconductor and magnetic materials under extreme temperature conditions (-200°C to 800°C), simulating real-world operational environments.
  • Magnetic Field & Vacuum Control: Integrates adjustable magnetic fields and vacuum chambers to study material behavior in controlled electromagnetic and atmospheric conditions.
  • Sample Manipulation: Features an adjustable sample holder and precise alignment mechanisms for detailed material characterization, such as surface texture analysis or electrical property measurement.

Key features

  • 1. Material Technology

  • With corrosion-resistant alloy construction, maintain structural integrity in extreme temperature and vacuum environments.

  • 2. Interactive Design

  • With a programmable touchscreen interface and multi-step presets, streamline complex testing protocols up to 40% faster than manual setups.

  • 3. Performance Parameters

  • With a temperature range from -196°C to 500°C, test materials across a broader spectrum than traditional probe stations limited to -100°C to 300°C.

  • 4. Scenario Solutions

  • With mobile carts and adjustable sample holders, easily reposition the setup and adapt to semiconductor or magnetic material research scenarios.

  • 5. Certification Standards

  • With CE certification, ensure compliance with international safety and performance standards, exceeding basic safety protocols of non-certified alternatives.

Product details

High and Low Temperature Vacuum Magnetic Field Probe Station for Testing Semiconductor Materials Magnetic Materials

The High and Low Temperature Vacuum Magnetic Field Probe Station is a precision instrument designed for advanced material analysis of semiconductors and magnetic materials under extreme conditions. Equipped with a programmable control panel, gas supply system, and mobile base, it offers customizable testing environments for researchers and engineers.

Technical specifications

FeatureSpecificationApplication Scenario
Temperature Range-196°C to 400°C (adjustable via liquid nitrogen/gas)Testing material properties under cryogenic or high-temperature conditions
Magnetic Field StrengthUp to 9 Tesla (adjustable)Evaluating magnetic response in semiconductors
Sample Precision0.1 µm resolution sample stageMicroscale material analysis and alignment
Vacuum EnvironmentIntegrated gas supply system (inert gases)Maintaining ultra-high vacuum for contamination-free testing
MobilityWheeled mobile carts with locking mechanismsFlexible repositioning in dynamic lab setups
CertificationCE compliantEnsures EU safety and regulatory compliance

Customization guide

Adjustable parameters include temperature range, magnetic field intensity, and sample stage dimensions to accommodate specialized testing needs. For instance, customize the gas supply system for specific inert gases or upgrade the vacuum seal for ultra-low pressure applications.

Get inspired

Unlock breakthroughs in semiconductor research with this versatile probe station. Whether studying quantum materials under cryogenic temperatures or analyzing magnetic properties at high fields, its precision and adaptability empower scientists to push the boundaries of material science.

Choose your model

ParameterBase ModelAdvanced ModelPro Model
Temperature Range-150°C to 300°C-196°C to 350°C (+23%)-196°C to 400°C (+33%)
Magnetic Field5 Tesla7 Tesla (+40%)9 Tesla (+80%)
Sample Size Capacity10x10 mm20x20 mm (+100%)30x30 mm (+200%)
Automation LevelManual controlSemi-automatedFully automated
Gas CompatibilityStandard inert gasesCustom gas mixturesMulti-gas support

Supplier's note

  1. Technical Breakthroughs:

    • CE certification ensures compliance with EU safety standards, enabling global deployment.
    • The integrated gas supply system reduces setup time by 40% compared to standalone gas solutions.
    • Precision sample stage allows sub-micron alignment, critical for nanoscale material testing.
  2. Optimal Version Selection:

    • Base Model: Ideal for academic labs requiring standard temperature/magnetic field ranges (e.g., basic semiconductor testing).
    • Advanced Model: Suited for industrial R&D teams needing extended temperature (-196°C) and semi-automated workflows.
    • Pro Model: Best for cutting-edge research (e.g., quantum computing materials) demanding extreme parameters and full automation.

With the Pro Model’s 9 Tesla magnetic field, you can simulate high-strength magnetic environments for next-gen semiconductor validation. Pair this with its 30x30 mm sample capacity to test large-scale prototypes efficiently. The Base Model’s mobility and manual controls make it perfect for small labs prioritizing flexibility over extreme specs.

Frequently asked questions

  • Which High and Low Temperature Probe Station model is best for semiconductor material testing in labs?

  • How to clean the sample holder of the Vacuum Magnetic Field Probe Station?

  • Can the probe station analyze both magnetic and semiconductor materials simultaneously?

  • Does the probe station support customization for specific sample sizes or experiments?

  • Is the High and Low Temperature Probe Station CE-certified for safety compliance?

  • What type of gas is required for the probe station’s gas cylinder and its operational role?

  • How does the mobile cart design enhance the probe station’s usability in labs?

  • What temperature and vacuum ranges does the Magnetic Field Probe Station offer?

Product comparison

CategoryUsage ScenariosCharacteristicsAdvantagesDisadvantages
Temperature RangeSemiconductor Testing, CryogenicsIndustry: -50°C to 200°C
Base: -196°C to 300°C ▲
Advanced: -269°C to 400°C ▲▲ (ISO 17025 compliant)
Enables extreme temperature testing (e.g., superconductors)Base requires LN2; Advanced needs specialized cooling systems
Magnetic Field StrengthQuantum Material Research, Magnetism StudiesIndustry: ≤7 Tesla
Base: 9 Tesla ▲
Advanced: 12 Tesla ▲▲ (ASTM E1839)
High-field analysis for advanced materials (e.g., topological insulators)Base: 9T requires shielding; Advanced: 12T increases power demand
Vacuum CapabilityContamination-Sensitive TestingIndustry: 1×10-5 Torr
Base: 1×10-6 Torr ▲
Advanced: 1×10-7 Torr ▲▲ (ISO 14644-1)
Ultra-high vacuum for precision measurements (e.g., SEM compatibility)Base: 24h pump time; Advanced: Requires maintenance of ultra-vacuum seals
Sample Size CapacityLarge Wafer/ Bulk Material AnalysisIndustry: ≤50mm diameter
Base: 80mm ▲
Advanced: 120mm ▲▲ (ASTM E8)
Handles full 12-inch wafers without cuttingBase: 80mm limits some industrial samples; Advanced: Requires larger lab space
MobilityFlexible Lab Setup, Multi-Location UseIndustry: Fixed installations
Base: Mobile carts with wheels ▲
Advanced: Reinforced carts + vibration dampers ▲▲
Easy relocation between labs (e.g., shared facilities)Base: Risk of minor vibrations during transport; Advanced: Heavier to move
Certification & ComplianceRegulatory-Compliant TestingIndustry: CE, ISO 9001
Base: CE, ISO 17025 ▲
Advanced: CE, ISO 17025 + NIST Traceability ▲▲
Advanced meets NIST standards for critical research (e.g., aerospace)Base: Limited to basic compliance; Advanced: Higher certification costs

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