Material Composition | High-purity semiconductor manufacturing | Industry Standard: 99% graphite (ISO 1450) Our Base: 99.5% ▲ (ISO 1450) Our Advanced: 99.9% ▲▲ (ISO 1450) | Minimizes impurities in silicon epitaxy; Base/Advanced reduce defects by 15%/30% | Advanced versions require specialized handling and higher costs due to purification |
Thermal Conductivity | Rapid thermal cycling in epitaxy chambers | Industry: 120 W/m·K (ASTM E1461) Base: 130 W/m·K ▲ (ASTM E1461) Advanced: 150 W/m·K ▲▲ (ASTM E1461) | Faster heat transfer improves process efficiency (up to 20% faster cooldown) | Higher conductivity increases energy demand for cooling systems |
Chemical Resistance | Exposure to reactive gases (e.g., CVD) | Industry: Resists 10 chemicals (ASTM D543) Base: 20 chemicals ▲ (ASTM D543) Advanced: 30 chemicals ▲▲ (ASTM D543) | Extended service life in corrosive environments (e.g., HF, NH₃ exposure) | Enhanced coatings may add 10–15% to production costs |
Thermal Shock Resistance | Frequent temperature changes (e.g., RTP) | Industry: Withstands 500°C ΔT (ASTM C693) Base: 600°C ▲ (ASTM C693) Advanced: 700°C ▲▲ (ASTM C693) | Reduced cracking risk in rapid thermal processing (RTP) cycles | Advanced designs may require thicker, heavier substrates for stability |
Surface Finish | Precision silicon epitaxy | Industry: Ra 0.8 µm (ISO 4287) Base: Ra 0.5 µm ▲ (ISO 4287) Advanced: Ra 0.3 µm ▲▲ (ISO 4287) | Smoother surfaces enhance film uniformity (≤5% thickness variation) | Finer finishes may be more prone to micro-scratches during handling |
Dimensional Stability | High-precision alignment systems | Industry: CTE 4.5 ppm/°C (ASTM E834) Base: 3.8 ppm/°C ▲ (ASTM E834) Advanced: 3.0 ppm/°C ▲▲ (ASTM E834) | Minimizes expansion/contraction errors (e.g., ±0.001 mm at 1000°C) | Lower CTE materials may exhibit brittleness under mechanical stress |