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  • Non-contact White Light Interferometer for Nano 3D Contour and Form Measurement
  • Non-contact White Light Interferometer for Nano 3D Contour and Form Measurement
  • Non-contact White Light Interferometer for Nano 3D Contour and Form Measurement
  • Non-contact White Light Interferometer for Nano 3D Contour and Form Measurement
  • Non-contact White Light Interferometer for Nano 3D Contour and Form Measurement
  • Non-contact White Light Interferometer for Nano 3D Contour and Form Measurement
Non-contact White Light Interferometer for Nano 3D Contour and Form Measurement

Non-contact White Light Interferometer for Nano 3D Contour and Form Measurement

  • 1 - 9 Pieces
    $10
  • >= 10 Pieces
    $1

Customization:

Packing（Min.Order: 1 pieces）
View product details

Non-contact White Light Interferometer for Nano 3D Contour and Form Measurement

Product overview

Core functionalities

Applicable scenarios

Unique advantages

  • Non-Contact Nano-Scale Measurement: Enables precise 3D contour and surface form analysis using white light interferometry, ideal for delicate or fragile materials without physical contact.
  • High-Precision Data Capture: Equipped with a high-resolution sensor for nano-level accuracy, generating detailed 3D surface maps and measurements of complex geometries.
  • Automated Measurement Processes: Streamlined operation via an intuitive digital control panel and software, ensuring consistent and repeatable results.

Key features

  • 1. Advanced Material Technology for Durable Precision

    • With its corrosion-resistant metal-plastic composite construction, you can ensure long-term structural integrity and reduce thermal expansion errors in variable environments, outperforming purely plastic models*.

  • 2. Intuitive Interactive Design for Seamless Operation

    • With the user-friendly digital interface and real-time 3D visualization, you can analyze surface contours and form deviations instantly, streamlining workflows versus traditional manual measurement systems*.

  • 3. Ultra-High-Resolution Performance for Nano-Scale Accuracy

    • With nano-scale resolution down to 1 nm, you can capture microscopic surface details with precision, enabling applications in semiconductor and nanotechnology research—up to 40% finer resolution than conventional optical profilers*.

  • 4. Multi-Industry Scenario Adaptability

    • Designed for both R&D labs and industrial production lines, this instrument supports quality control in aerospace, automotive, and medical device manufacturing, offering broader versatility than single-purpose systems*.

  • 5. Certified Compliance for Global Standards

    • Complying with ISO 10110 standards for precision optics, you can ensure adherence to global metrology protocols, meeting regulatory requirements more rigorously than non-certified measurement tools*.

Product details

Non-contact White Light Interferometer for Nano 3D Contour and Form Measurement

The CHOTEST Non-contact White Light Interferometer is a high-precision optical instrument designed for nano-scale 3D contour and form measurement. With a sleek, ergonomic design and advanced automation, it delivers accurate surface analysis for applications in aerospace, automotive, and medical device manufacturing.

Technical specifications

FeatureSpecificationBenefit
Non-contact MeasurementWhite Light InterferometryAnalyze delicate surfaces without damage
Material CompositionPlastic, metal, and hybrid metal-plastic componentsLightweight yet durable construction
Precision±0.5 nm resolutionNano-scale accuracy for critical tasks
Automation LevelProgrammable scan protocolsStreamlined workflows and repeatability
Software InterfaceUser-friendly GUI with 3D surface mapsIntuitive data visualization and analysis
Warranty1-year manufacturer warrantyComprehensive coverage for peace of mind

Customization guide

Adjustable parameters such as measurement resolution, scan area, and sensor sensitivity can be tailored to meet specialized needs like micro-structure inspection or high-volume production quality control.

Get inspired

Whether you’re analyzing medical device surfaces, validating automotive components, or researching nanotechnology, this interferometer combines cutting-edge precision with intuitive operation. Its 3D surface mapping capability transforms complex geometries into actionable insights.

Choose your model

ParameterBase ModelAdvanced ModelPro Model
Measurement Resolution1 nm+15% (0.85 nm)+30% (0.7 nm)*
Scan Speed10 scans/min12 scans/min (+20%)15 scans/min (+50%)
Software FeaturesBasic analysisAdvanced algorithmsAI-driven analytics
AutomationManual setupSemi-automatedFully automated

Supplier's note

  1. Technical Breakthroughs:

    • High-precision sensor array: Achieves ±0.5 nm resolution, enabling nanoscale defect detection.
    • AI-driven software: The Pro model’s algorithms reduce analysis time by 40% compared to traditional methods.
    • Customizable scan protocols: Users can adjust parameters like field of view and resolution to match specific material or application requirements.

  2. Version Selection Guide:

    • Base Model: Ideal for educational labs or small-scale R&D with basic measurement needs.
    • Advanced Model: Suitable for mid-tier manufacturing quality control, offering faster scans and enhanced algorithms for complex geometries.
    • Pro Model: Best for high-stakes industries like aerospace or semiconductor manufacturing, where ultra-high resolution and full automation are critical.

    With the Pro model’s 0.7 nm resolution, you can ensure flawless surface finishes for precision components. Its AI analytics paired with automated workflows cut downtime, delivering measurable ROI in high-volume production environments.

Frequently asked questions

  • Which model of CHOTEST Non-contact White Light Interferometer is best suited for aerospace applications?

  • How do I maintain the sensor on a CHOTEST Nano 3D Contour Measurement Instrument?

  • What materials are used in the construction of the CHOTEST White Light Interferometer, and how do they affect durability?

  • Can the CHOTEST Non-contact Interferometer be customized for specific surface roughness measurements?

  • Is the CHOTEST Nano 3D Measurement System certified for ISO or other industry standards?

  • Why choose a non-contact white light interferometer over contact probes for nano-scale measurements?

  • Does the CHOTEST instrument support automated measurement routines for high-volume quality control?

  • How does the CHOTEST system ensure accuracy in complex 3D surface contour measurements?

Product comparison

CategoryUsage ScenariosCharacteristicsAdvantagesDisadvantages
Measurement ResolutionSemiconductor Manufacturing, Nanotech R&DIndustry Standard: 1 nm (ISO 10110)
Our Base: 0.5 nm (ISO 10110) ▲
Our Advanced: 0.1 nm (ISO 10110) ▲▲▲		Enables nano-scale analysis for precision components (e.g., microchips).Higher resolution models may require frequent recalibration (▲▲▲ denotes 5× improvement).
Measurement SpeedQC Labs, Production LinesIndustry Standard: 10 sec/scan (ASTM E2352)
Our Base: 5 sec/scan ▲
Our Advanced: 2 sec/scan ▲▲▲		Reduces downtime in mass production (e.g., automotive part inspection).Faster scans may trade off minor resolution (▲▲▲ = 5× speed boost).
Durability (Material Build)Industrial Use, 24/7 OperationsIndustry Standard: Plastic chassis (MTBF: 500 hrs)
Our Base: Metal-plastic hybrid (MTBF: 1000 hrs) ▲
Our Advanced: All-metal (MTBF: 2000 hrs) ▲▲		Survives harsh environments (e.g., factory floors).Heavier models require stable mounting (▲▲ = 2× MTBF improvement).
Software & AutomationR&D Labs, QA DepartmentsIndustry Standard: Basic tools (ISO 17025)
Our Base: Automated reporting ▲
Our Advanced: AI defect detection ▲▲		Streamlines data interpretation (e.g., medical device validation).Advanced features need training (▲▲ = 2× faster analysis).
Non-contact MeasurementSensitive Materials, Delicate SamplesIndustry Standard: Contact probes (risk of damage)
Our Base: White light interferometry (no sample damage) ▲
Our Advanced: Adaptive focus ▲▲		Prevents contamination in pharmaceutical or semiconductor applications.Limited on highly reflective surfaces (▲▲ = 2× precision boost).
Warranty & SupportLong-term Investment, Critical SystemsIndustry Standard: 1 year (standard coverage)
Our Base: 2 years ▲
Our Advanced: 3 years + priority support ▲▲		Reduces downtime risks for mission-critical infrastructure (e.g., aerospace).Extended warranties increase upfront costs (▲▲ = 3× coverage period).

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